Semiconductor

Industry Overview

The chip industry has always been pursuing yield optimization during wafer manufacturing. Traditional manual inspection methods require long hours of inspection staff. The size of a single crystallite of a silicon wafer is extremely small, the diameter of its contact area is usually 50μm only, 2/3 of the cross-sectional area of a hair. Traditionally, it requires human inspection with microscopes, which is not only time-consuming and costly, but also difficult to trace back should there be any quality issue.

Technology

In the era of Industry 4.0, SmartMore’s self-developed smart PCB (printed circuit board) Imaging System applied our architecture to the collection and processing of super big images for PCB. When materials are sent to the equipment, robotic arms will automatically finish material collection, double-sided line scan, coding and compressing, image output, etc. The system provides images as precise as 7µm, while increasing the production efficiency of the factory by 30%.

industry_semiconductor_01_technology
industry_semiconductor_01_technology

Technology

In the era of Industry 4.0, SmartMore’s self-developed smart PCB (printed circuit board) Imaging System applied our architecture to the collection and processing of super big images for PCB. When materials are sent to the equipment, robotic arms will automatically finish material collection, double-sided line scan, coding and compressing, image output, etc. The system provides images as precise as 7µm, while increasing the production efficiency of the factory by 30%.

industry_semiconductor_02_solution & application

Solution & Application

SmartMore has collaborated with multiple leading enterprises in the field of semiconductor, including wafer detection, PCB detection, chip craft analysis, etc. With SMore ViMo, our clients in the semiconductor industry can accurately identify and locate defects on wafers, their batch information, types and location. Moreover, with these data collected from the production line, they were provided with statistics and analysis of process defects to identify patterns and quickly locate the steps and causes to the quality issues.

industry_semiconductor_02_solution & application

Solution & Application

SmartMore has collaborated with multiple leading enterprises in the field of semiconductor, including wafer detection, PCB detection, chip craft analysis, etc. With SMore ViMo, our clients in the semiconductor industry can accurately identify and locate defects on wafers, their batch information, types and location. 
Moreover, with these data collected from the production line, they were provided with statistics and analysis of process defects to identify patterns and quickly locate the steps and causes to the quality issues.

Performance

Pass rate

0 %

Overkill rate

0 %

Save

0 %

of manpower cost

  • Processing speed of the production line ≤ 0.1 seconds/piece
  • Process 1,000,000+ pieces daily on average

*The above numbers are calculated based on the average performance of SmartMore’s solutions on the clients’ production lines.

Innovation

As one of the largest pioneer for smart manufacturing, SmartMore’s technology breaks limitations, providing a truly comprehensive platform that can be applied cross-industries. As a result, our technology grows more and more powerful and mature from the learning through various industries, whether it’s automotive, electronics, semiconductors, or digital experience, etc.